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DP-BIST: A Built-In Self Test For DSP DataPaths A Low Overhead and High Fault Coverage Technique.

Saman AdhamSanjay Gupta
Published in: Asian Test Symposium (1996)
Keyphrases
  • low overhead
  • built in self test
  • high reliability
  • integrated circuit
  • dynamic programming
  • high precision
  • load balancing
  • shared memory
  • signal processing
  • communication cost
  • energy efficient
  • low cost