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DP-BIST: A Built-In Self Test For DSP DataPaths A Low Overhead and High Fault Coverage Technique.
Saman Adham
Sanjay Gupta
Published in:
Asian Test Symposium (1996)
Keyphrases
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low overhead
built in self test
high reliability
integrated circuit
dynamic programming
high precision
load balancing
shared memory
signal processing
communication cost
energy efficient
low cost