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Risk assessment of the crack propagation and delamination of the Cu-to-Cu direct bonded (CuDB) interface.
Ah-Young Park
Satish C. Chaparala
Seungbae Park
Published in:
Microelectron. Reliab. (2016)
Keyphrases
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risk assessment
risk management
mechanical properties
risk analysis
risk factors
information security
electron microscopy
decision making
evidence theory
economic impact
network security
situation assessment
unsupervised learning
data collection
decision support system
emergency management
fuzzy logic
databases