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Mission Profile Approach for the Calculation of GaN FET Reliability in Power Supply Applications (Invited).

Sandeep R. BahlJungwoo JohFei Yang
Published in: IRPS (2024)
Keyphrases
  • power supply
  • energy supply
  • intelligent control
  • high power
  • high frequency
  • control unit
  • neural network
  • feature extraction
  • neuro fuzzy
  • rbf neural network
  • high density