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Distinct degradation processes in ZnO varistors: reliability analysis and modeling with accelerated AC tests.
Hadi Yadavari
Mustafa Altun
Published in:
Turkish J. Electr. Eng. Comput. Sci. (2017)
Keyphrases
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reliability analysis
data mining
artificial intelligence
simulated annealing
decision making
decision trees
relational databases
control system
thin film
statistical modeling
survival analysis
condition monitoring