Collaborative Learning Classification Model for PCBs Defect Detection Against Image and Label Uncertainty.
Xinyi YuHan-Xiong LiHaidong YangPublished in: IEEE Trans. Instrum. Meas. (2023)
Keyphrases
- defect detection
- collaborative learning
- single image
- image data
- image features
- input image
- multiscale
- image classification
- image representation
- image content
- image retrieval
- image regions
- high resolution
- image segmentation
- case study
- test images
- learning algorithm
- segmentation method
- semantic labels
- textured surfaces
- machine learning
- raster scan
- pixel values
- image set
- multi label
- keypoints
- segmentation algorithm
- image analysis