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Application of Fault Parallelism to the Automatic Test Pattern Generation for Sequential Circuits.

Peter A. KraussKurt Antreich
Published in: Parallel Computer Architectures (1993)
Keyphrases
  • data sets
  • neural network
  • decision trees
  • case study
  • data driven
  • fully automatic
  • knowledge base
  • data structure
  • semi automatic
  • computational power