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Electric field for detecting open leads in CMOS logic circuits by supply current testing.
Masaki Hashizume
Masahiro Ichimiya
Hiroyuki Yotsuyanagi
Takeomi Tamesada
Published in:
ISCAS (3) (2005)
Keyphrases
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logic circuits
electric field
low power
low cost
high speed
low voltage
real time
pattern recognition
power consumption
power supply