A General Architecture for Factory-based Diagnosis of Electronics.
Scott L. KaplinGeorge D. HaddenLina VolovikRick SwansonPublished in: IEA/AIE (Vol. 1) (1988)
Keyphrases
- model based diagnosis
- model based reasoning
- fault diagnosis
- medical diagnosis
- automatic diagnosis
- multiple faults
- attention deficit hyperactivity disorder
- electrical engineering
- diagnostic reasoning
- scanning electron microscope
- artificial intelligence
- search engine
- computer vision
- cancer diagnosis
- clinical diagnosis
- medical diagnostic