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Simulated fault injection methodology for gate-level quantum circuit reliability assessment.

Mihai UdrescuLucian ProdanMircea Vladutiu
Published in: Simul. Model. Pract. Theory (2012)
Keyphrases
  • reliability assessment
  • fault injection
  • high speed
  • cmos technology
  • logic circuits
  • fault model
  • bp neural network model
  • power system