A method to recover critical bits under a double error in SEC-DED protected memories.
Shanshan LiuPedro ReviriegoLiyi XiaoJuan Antonio MaestroPublished in: Microelectron. Reliab. (2017)
Keyphrases
- preprocessing
- significant improvement
- high precision
- experimental evaluation
- computational cost
- high accuracy
- synthetic data
- detection algorithm
- feature set
- error accumulation
- average error
- relative error
- optimization method
- detection method
- theoretical analysis
- model selection
- similarity measure
- dynamic programming
- prior knowledge
- objective function
- multiscale
- training data