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Random pattern generation for post-silicon validation of DDR3 SDRAM.

Hao-Yu YangShih-Hua KuoTzu-Hsuan HuangChi-Hung ChenChris LinMango Chia-Tso Chao
Published in: VTS (2015)
Keyphrases
  • pattern generation
  • cellular automaton
  • low cost
  • swarm robots
  • high speed
  • database systems
  • image sequences
  • bayesian networks
  • video sequences
  • high density