Login / Signup
Random pattern generation for post-silicon validation of DDR3 SDRAM.
Hao-Yu Yang
Shih-Hua Kuo
Tzu-Hsuan Huang
Chi-Hung Chen
Chris Lin
Mango Chia-Tso Chao
Published in:
VTS (2015)
Keyphrases
</>
pattern generation
cellular automaton
low cost
swarm robots
high speed
database systems
image sequences
bayesian networks
video sequences
high density