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Layout-Oriented Defect Set Reduction for Fast Circuit Simulation in Cell-Aware Test.

Hsuan-Wei LiuBing-Yang LinCheng-Wen Wu
Published in: ATS (2016)
Keyphrases
  • high speed
  • feature space
  • small number
  • test cases
  • neural network
  • artificial intelligence
  • case study
  • evolutionary algorithm
  • probability distribution
  • test data
  • simulation model