Login / Signup
Image analysis methods for solderball inspection in integrated circuit manufacturing.
Wolf-Ekkehard Blanz
Jorge L. C. Sanz
Eric B. Hinkle
Published in:
IEEE J. Robotics Autom. (1988)
Keyphrases
</>
integrated circuit
image analysis
computational cost
real time
image processing
significant improvement
machine learning
image segmentation
machine learning methods
visual inspection
computer vision
pattern recognition
preprocessing
empirical studies
quality control