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A performance model and code overlay generator for scratchpad enhanced embedded processors.

Michael A. BakerAmrit PandaNikhil GhadgeAniruddha KadneKaram S. Chatha
Published in: CODES+ISSS (2010)
Keyphrases
  • high quality
  • probabilistic model
  • machine vision
  • image sequences
  • multiscale
  • multiresolution