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Characterization and FE analysis on the shear test of electronic materials.
Marcel Gonzalez
Bart Vandevelde
R. Van Hoof
Eric Beyne
Published in:
Microelectron. Reliab. (2004)
Keyphrases
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image analysis
databases
information retrieval
artificial intelligence
computer vision
decision making
knowledge base
image processing
clustering algorithm
medical images
finite element