Use of Paraplanar Constraint for Parallel Inspection of Wafer Bump Heights.

Mei Dong Ronald Chung Edmund Y. Lam Kenneth S. M. Fung

Published in: IPCV (2007)

Keyphrases

massively parallel
parallel processing
semiconductor manufacturing
website
shared memory
visual inspection
objective function
association rules
search space
parallel machines
parallel computation
parallel architectures
constrained minimization
parallel hardware
distributed memory machines