Login / Signup

Fast statistical model of TiO2 thin-film memristor and design implication.

Miao HuHai LiRobinson E. Pino
Published in: ICCAD (2011)
Keyphrases
  • statistical model
  • thin film
  • statistical models
  • genetic algorithm
  • high density
  • neural network
  • multi layer
  • control points
  • statistical distribution
  • chemical vapor deposition