Login / Signup

Built-In Self-Test and Recovery Procedures for Molecular Electronics-Based Nanofabrics.

Mohammad TehranipoorReza M. Rad
Published in: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (2007)
Keyphrases
  • built in self test
  • electrical engineering
  • databases
  • image recovery
  • integrated circuit
  • search engine
  • search algorithm
  • real time
  • genetic algorithm
  • three dimensional
  • molecular dynamics