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Influence of γ-ray total dose radiation effect on the hot carrier gate current of the uniaxial strained Si nano-scale NMOSFET.

Minru HaoHuiyong HuChen-Guang LiaoBin WangHaiyan KangHe-Ming Zhang
Published in: Microelectron. Reliab. (2017)
Keyphrases
  • nano scale
  • leakage current
  • low voltage
  • x ray
  • multi view
  • thin film
  • metal oxide