Comparison of contactless measurement and testing techniques to a all-silicon optical test and characterization method.
Selahattin SayilDavid V. KernsSherra E. KernsPublished in: IEEE Trans. Instrum. Meas. (2005)
Keyphrases
- detection method
- high precision
- test data
- clustering method
- computational complexity
- classification method
- experimental evaluation
- similarity measure
- high accuracy
- classification accuracy
- preprocessing
- edge detection
- segmentation algorithm
- computational cost
- cost function
- segmentation method
- pairwise
- neural network
- field of view