Power transition X filling based selective Huffman encoding technique for test-data compression and Scan Power Reduction for SOCs.
Lokesh SivanandamSakthivel PeriyasamyOorkavalan UmamaheswariPublished in: Microprocess. Microsystems (2020)
Keyphrases
- test data
- power reduction
- power consumption
- arithmetic coding
- power saving
- low power
- test cases
- training data
- test set
- power dissipation
- image compression
- data sets
- compression algorithm
- compression ratio
- training and test data
- training set
- multithreading
- data center
- energy efficiency
- energy saving
- lossless compression
- search based testing
- training samples
- high speed
- learning algorithm
- real time