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Massive statistical process variations: A grand challenge for testing nanoelectronic circuits.
Bernd Becker
Sybille Hellebrand
Ilia Polian
Bernd Straube
Wolfgang Vermeiren
Hans-Joachim Wunderlich
Published in:
DSN Workshops (2010)
Keyphrases
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grand challenge
autonomous driving
information retrieval
low cost
process model
stereo vision
development process
database
case study
statistical models