Login / Signup
Degree-of-Freedom Analysis for Sequential Machines Targeting BIST Quality and Gate Area.
Samir Roy
Biplab K. Sikdar
Monalisa Mukherjee
Debesh K. Das
Published in:
VLSI Design (2002)
Keyphrases
</>
high quality
image analysis
quantitative analysis
databases
image processing
image segmentation
database systems
computational complexity
data analysis
mathematical analysis