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Arbitrary Two-Pattern Delay Testing Using a Low-Overhead Supply Gating Technique.
Swarup Bhunia
Hamid Mahmoodi
Arijit Raychowdhury
Kaushik Roy
Published in:
J. Electron. Test. (2008)
Keyphrases
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low overhead
high reliability
load balancing
shared memory
energy efficient
communication cost
multimedia
data structure
test cases
high precision
communication networks
scheduling algorithm