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Arbitrary Two-Pattern Delay Testing Using a Low-Overhead Supply Gating Technique.

Swarup BhuniaHamid MahmoodiArijit RaychowdhuryKaushik Roy
Published in: J. Electron. Test. (2008)
Keyphrases
  • low overhead
  • high reliability
  • load balancing
  • shared memory
  • energy efficient
  • communication cost
  • multimedia
  • data structure
  • test cases
  • high precision
  • communication networks
  • scheduling algorithm