Fully Convolutional Networks for Chip-wise Defect Detection Employing Photoluminescence Images.
Maike Lorena SternMartin SchellenbergerPublished in: CoRR (2019)
Keyphrases
- defect detection
- image data
- image database
- three dimensional
- input image
- image analysis
- ground truth
- image matching
- edge detection
- image features
- image collections
- image retrieval
- object recognition
- image classification
- test images
- multiple images
- image annotation
- rigid body
- social networks
- image processing algorithms
- textured surfaces
- complex networks
- high speed
- image set
- natural images
- similarity measure
- machine learning