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200 V Fast Recovery Epitaxial Diode with superior ESD capability.

Andrea IraceLuca MarescaPaolo MironeMichele RiccioGiovanni BreglioL. BellemoR. CartaM. NarettoN. El BaradaiI. ParaN. Di Santo
Published in: Microelectron. Reliab. (2016)
Keyphrases
  • computer simulation
  • thin film
  • recovery algorithm
  • electrical properties
  • schottky barrier
  • data sets
  • databases
  • similarity measure
  • light emitting