A new type of quantum wells: stacking faults in silicon carbide.

Hisaomi Iwata Ulf Lindefelt Sven Öberg Patrick R. Briddon

Published in: Microelectron. J. (2003)

Keyphrases

low cost
fault diagnosis
fault detection
real time
neural network
high speed
data sets
feature selection
expert systems
wavelet transform
software engineering
model based diagnosis
quantum computing