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Stress-Lysis: A DNN-Integrated Edge Device for Stress Level Detection in the IoMT.
Laavanya Rachakonda
Saraju P. Mohanty
Elias Kougianos
Prabha Sundaravadivel
Published in:
IEEE Trans. Consumer Electron. (2019)
Keyphrases
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detection accuracy
data sets
false alarms
automatic detection
multiscale
false positives
edge detection
real world
event detection
change detection
detection method
detection algorithm
high level
object detection
image segmentation
decision trees
computer vision
learning algorithm
junction detection
circle detection