Login / Signup
Adaptive test selection for post-silicon timing validation: A data mining approach.
Ming Gao
Peter Lisherness
Kwang-Ting (Tim) Cheng
Published in:
ITC (2012)
Keyphrases
</>
selection algorithm
data sets
test data
real time
data mining
website
decision trees
artificial neural networks
low cost
statistical tests
selection criteria
adaptive systems