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Adaptive test selection for post-silicon timing validation: A data mining approach.

Ming GaoPeter LishernessKwang-Ting (Tim) Cheng
Published in: ITC (2012)
Keyphrases
  • selection algorithm
  • data sets
  • test data
  • real time
  • data mining
  • website
  • decision trees
  • artificial neural networks
  • low cost
  • statistical tests
  • selection criteria
  • adaptive systems