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The Dependence of BTI and HCI-Induced Frequency Degradation on Interconnect Length and Its Circuit Level Implications.
Xiaofei Wang
Qianying Tang
Pulkit Jain
Dong Jiao
Chris H. Kim
Published in:
IEEE Trans. Very Large Scale Integr. Syst. (2015)
Keyphrases
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high speed
human computer interaction
frequency response
higher level
shift register
levels of abstraction
database
real time
data mining
information retrieval
social networks
augmented reality
low power
maximum number