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Pseudorandom BIST for test and characterization of linear and nonlinear MEMS.
Achraf Dhayni
Salvador Mir
Libor Rufer
Ahcène Bounceur
Emmanuel Simeu
Published in:
Microelectron. J. (2009)
Keyphrases
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pseudorandom
random number
uniformly distributed
secret key
built in self test
decision trees
data structure
statistical significance
random numbers
neural network
real world
social networks
computer vision
case study
uniform distribution