A Simplified Algorithm for Testing Microprocessors.
Kewal K. SalujaLi ShenStephen Y. H. SuPublished in: ITC (1983)
Keyphrases
- detection algorithm
- improved algorithm
- optimal solution
- experimental evaluation
- computational complexity
- high accuracy
- np hard
- objective function
- significant improvement
- worst case
- probabilistic model
- single pass
- estimation algorithm
- convergence rate
- tree structure
- segmentation method
- computational cost
- neural network
- learning algorithm
- similarity measure
- preprocessing
- cost function
- data sets
- optimization algorithm
- search space
- experimental study
- lower bound
- segmentation algorithm
- classification algorithm
- path planning
- expectation maximization
- recognition algorithm
- image processing