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VLSI Testing for High Reliability: Mixing IDDQ Testing With Logic Testing.

Suntae HwangRochit Rajsuman
Published in: VLSI Design (1997)
Keyphrases
  • high reliability
  • test cases
  • computer vision
  • case study
  • expert systems
  • software testing
  • databases
  • information systems
  • hidden markov models
  • correlation analysis