Classification of Photometric Factors Based on Photometric Linearization.
Yasuhiro MukaigawaYasunori IshiiTakeshi ShakunagaPublished in: ACCV (2) (2006)
Keyphrases
- pattern recognition
- classification accuracy
- pattern classification
- automatic classification
- decision trees
- feature vectors
- decision rules
- classification process
- neural network
- feature space
- classification scheme
- image classification
- supervised classification
- photometric stereo
- image formation
- class labels
- factors affecting
- discriminative power
- stereo method
- svm classifier
- semi supervised
- object recognition
- cross validation
- support vector machine svm
- supervised learning
- support vector machine
- active learning
- classification systems
- image processing
- machine learning
- factors influencing
- data mining