Optimizing Stresses for Testing DRAM Cell Defects Using Electrical Simulation.

Zaid Al-Ars Ad J. van de Goor Jens Braun Detlev Richter

Published in: DATE (2003)

Keyphrases

low voltage
simulation model
simulation models
real time
printed circuit boards
database
mathematical model
transmission line
multi agent
main memory
power grid
physical characteristics