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Inference of Suitable for Required Specification Analog Circuit Topology using Deep Learning.
Teruki Matsuba
Nobukazu Takai
Masafumi Fukuda
Yusuke Kubo
Published in:
ISPACS (2018)
Keyphrases
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deep learning
analog circuits
machine learning
unsupervised learning
unsupervised feature learning
fault diagnosis
mental models
image processing
digital circuits
bayesian networks
multiscale
viewpoint
co occurrence
decision process
feature selection
artificial intelligence
neural network