Measurement of Integrated PA-to-LNA Isolation on Si CMOS Chip.

Ryo Minami Jee Young Hong Kenichi Okada Akira Matsuzawa

Published in: IEICE Trans. Electron. (2011)

Keyphrases

analog vlsi
high speed
low cost
cmos image sensor
circuit design
single chip
image sensor
cmos technology
low power
chip design
data acquisition
focal plane
solid state
random access memory
power consumption
nm technology
dynamic range
ultra low power
vlsi implementation
low voltage
mixed signal
high density
metal oxide