Compressed Bit Fail Maps for Memory Fail Pattern Classification.
Jörg E. VollrathUlf LedererThomas HladschikPublished in: J. Electron. Test. (2001)
Keyphrases
- pattern classification
- pattern recognition
- pattern classification problems
- feature extraction
- nearest neighbor rule
- vowel recognition
- data structure
- feature subset selection
- data sets
- image processing
- multiscale
- artificial neural networks
- support vector machine
- image classification
- parzen window
- mass spectrometry data