A deep CNN for Image Analytics in Automated Manufacturing Process Control.
Manuella KadarDaniela OnitaPublished in: ECAI (2019)
Keyphrases
- process control
- semiconductor manufacturing
- input image
- manufacturing process
- single image
- image data
- image features
- product quality
- image content
- image representation
- image retrieval
- multiscale
- image classification
- edge detection
- template matching
- high resolution
- image segmentation
- image analysis
- intelligent control
- image pixels
- image structure
- hough transform
- image matching
- case study
- test images
- spatial information
- segmentation method
- data mining
- business intelligence
- segmentation algorithm
- feature points
- control system
- multiresolution