Sign in
An Offset-Tolerant Dual-Reference-Voltage Sensing Scheme for Deep Submicrometer STT-RAM.
Taehui Na
Jisu Kim
Byungkyu Song
Jung Pill Kim
Seung-Hyuk Kang
Seong-Ook Jung
Published in:
IEEE Trans. Very Large Scale Integr. Syst. (2016)
Keyphrases
</>
reference frame
data mining
power system
classification scheme
detection scheme
real time
data acquisition
learning scheme