A New Transistor-Redundant Voter for Defect-Tolerant Digital Circuits.

Hayssam El-Razouk Zine Abid

Published in: CCECE (2006)

Keyphrases

digital circuits
circuit design
high speed
evolvable hardware
data flow
defect detection
integrated circuit
functional decomposition
finite state machines
voting scheme
decision diagrams
low power
model based diagnosis
highly redundant
database
dynamic systems
relational databases
databases