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Analysis of Ultra-Thin-Body SOI Subthreshold SRAM Considering Line-Edge Roughness, Work Function Variation, and Temperature Sensitivity.
Vita Pi-Ho Hu
Ming-Long Fan
Pin Su
Ching-Te Chuang
Published in:
IEEE J. Emerg. Sel. Topics Circuits Syst. (2011)
Keyphrases
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statistical analysis
power consumption
computer vision
high speed
image processing
parallel processing
edge information
mathematical analysis