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A Method for Local Parametric Fault Diagnosis of a Broad Class of Analog Integrated Circuits.
Michal Tadeusiewicz
Stanislaw Halgas
Published in:
IEEE Trans. Instrum. Meas. (2018)
Keyphrases
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fault diagnosis
integrated circuit
bp neural network
multi sensor information fusion
support vector machine
fault detection
neural network
expert systems
analog circuits
fault tree
real time
data mining
artificial intelligence