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A System-Level Framework for Analytical and Empirical Reliability Exploration of STT-MRAM Caches.

Elham CheshmikhaniHamed FarbehHossein Asadi
Published in: IEEE Trans. Reliab. (2020)
Keyphrases
  • bayesian framework
  • probabilistic model
  • theoretical framework
  • conceptual framework
  • data mining
  • genetic algorithm
  • feature selection
  • database systems
  • main contribution