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An on-chip frequency programmable test clock generation and application method for small delay defect detection.
Songwei Pei
Huawei Li
Song Jin
Jun Liu
Xiaowei Li
Published in:
Integr. (2015)
Keyphrases
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experimental evaluation
high speed
generation method
similarity measure
test data
synthetic data
detection method
probabilistic model
support vector machine
statistical significance
data sets
significant improvement
low cost
edge detection
k means
classification method
preprocessing
objective function
neural network