Yield-Driven Redundant Via Insertion Based on Probabilistic Via-Connection Analysis.

Jin-Tai Yan Bo-Yi Chiang Zhi-Wei Chen

Published in: ICECS (2006)

Keyphrases

image analysis
statistical analysis
artificial intelligence
bayesian networks
multiscale
probabilistic model
data sets
databases
neural network
machine learning
computer vision
three dimensional
information technology
data driven