Guest Editorial: Analog, Mixed-Signal and RF Testing.

Manuel J. Barragan William R. Eisenstadt

Published in: J. Electron. Test. (2017)

Keyphrases

mixed signal
low power
multi channel
vlsi circuits
digital circuits
high speed
power consumption
low cost
cmos technology
special issue
radio frequency
low voltage
relevance feedback
digital camera
parallel computing
single chip
digital signal processing
optical flow
pattern recognition