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Industrial approach to the chip and package reliability of SiC MOSFETs (Invited).
Elena Mengotti
Enea Bianda
David Baumann
Gerd Schlottig
Francisco Canales
Published in:
IRPS (2023)
Keyphrases
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high speed
industrial applications
low cost
high density
programmable logic
neural network
failure rate
technology transfer
vlsi implementation
genetic algorithm
researchers and practitioners
circuit design
single chip
host computer