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Built-in Self Test Based on Multiple On-Chip Signature Checking.

Mohammed Fadle AbdullaC. P. RavikumarAnshul Kumar
Published in: J. Electron. Test. (1999)
Keyphrases
  • built in self test
  • low cost
  • high speed
  • artificial intelligence
  • physical design
  • website
  • signal processing
  • operating system