Erratum to "A Test Response Compression Method for Monolithic 3-D ICs Based on 3-D Haar Wavelet Transforms".
Jing HuYuheng LinMing HuHongjian WangPublished in: IEEE Trans. Instrum. Meas. (2021)
Keyphrases
- significant improvement
- high accuracy
- test data
- lossless image compression
- dynamic programming
- objective function
- computational cost
- wavelet decomposition
- image compression
- wavelet analysis
- edge detection
- cost function
- clustering method
- high frequency
- image processing
- compression algorithm
- compression scheme
- pairwise
- phase shifting